Built-in Self-Test - Globe Thesis

Font Size: a A A

Keyword [Built-in Self-Test] Result: 21 - 40 \| Page: 2 of 7
21.	BIST-Based Delay-Fault Testing Of FPGA Device
22.	The Research On BIST Technology And A BIST Scheme For Mixed-signal Circuit
23.	Research On Deterministic Logic Built-In Self-Test
24.	The Study On Built-in Self-test (BIST) For Integrated Circuits Based-on Multiple Scan Chains
25.	Study Of Embedded Memory DFT Algorithm Based On BIST
26.	A Study On Memory Built-in Self-Test And Functional Core Testing
27.	Research And Implementation Of Low-power Test Structure Based On Segment Transformation
28.	Research On Circuit Fault Diagnosis And Low-Power Test
29.	Full Custom Design And Realization Of Static Random Access Memory IP Core
30.	The Design And Realization Of The Built-in Self Test In X Microprocessor
31.	The Research And Simulation Of Embedded RAM Testing
32.	The Design Of BIST For Mixed-signal Circuits Based On The Functional Test
33.	Study On Mixed-signal BIST Based On Pseudo-random Testing
34.	Research On Design For Testability Of ASIC And Embedded Memories
35.	DFT Design In Labeling Algorithm Chip
36.	Built-in Self-test Design Of Embedded SRAM
37.	Research On Embedded Memory Built-in Self-test And Built-in Self-repair
38.	The Study On Built-in Self-Test Method Based On Multi-Scan Chains
39.	The BIST Design And Implementation Of Onboard Processor Pipeline
40.	Research And Application Of Design For Test In Digitial IC Design
<<First <Prev Next> Last>> Jump to