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Keyword [basal plane]
Result: 1 - 20 | Page: 1 of 1
1.
Shape-Control Synthesis, Surface Decoration And Catalytic Performance Of Low Dimensional Metal Sulfides
2.
Study On The Formation Of Ring Layer Orientation By Polarized Raman Spectra
3.
Preparation And The Study On The Photocatalytic Hydrogen Performance Of Molybdenum Disulfide Based Photocatalysis
4.
Role of water chemistry in oil sands processing
5.
Evolution of extended defects in PVT-grown 4H-silicon carbide single crystals
6.
Growth of low basal plane dislocation density epilayers of 4H-silicon carbide for stable bipolar diodes
7.
A first-principles study of elastic and diffusion properties of magnesium based alloys
8.
Measurements of dislocation velocity in sapphire (alpha-alumina) single crystals
9.
Molecular dynamics computer simulations of surface and interface phenomena in vitreous silica and faceted grain boundaries of alpha-alumina containing intergranular films
10.
Electrochemical deposition of silver and platinum nano-crystallites on the atomically smooth graphite basal plane: Characterization, particle size control, and chemical applications
11.
Superconducting and normal state properties of oxygen deficient yttrium barium(2) copper(3) oxygen(y) single crystals
12.
Effects of microstructure on heterogeneous electron transfer at carbon electrodes
13.
Application of X-Ray Topographic Techniques to Investigate Defect Behavior in PVT-Grown 4H-SiC Crystal
14.
Synthesis And Catalytic Performance Of Defective Mo-based Sulfide Catalysts For Lignin-oil Hydrodeoxygenation
15.
Study On The Optimization Strategy Of Molybdenum Disulfide Electrocatalysts For Hydrogen Evolution Reaction
16.
Activation Of The Basal Plane Of MoS
2
And Its Electrocatalytic Hydrogen Evolution Reaction
17.
Activiation Of 2D Molybdenum Disulphide Surface And The Electrocatalytic Activity
18.
Activating The Basal Plane Of 1T Phase Molybdenum Disulfide For Electrocatalytic Hydrogen Evolution
19.
Study On Basal Plane Dislocations And Micropipe Defects In SiC Single Crystal
20.
Study On Surface Damage And Wafer Shape Changes During Mechanical Processing Of 4H-SiC Substrates
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