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Keyword [thin film interconnect]
Result: 1 - 2 | Page: 1 of 1
1.
The Morphological Evolution For A Void In Thin-film Interconnect Of Integrated Circuit Analyzed By Phase-field Method
2.
The Morphological Evolution And Concrescence Mechanism For A Damnification In Thin-film Interconnect Of Integrated Circuit Analyzed By Phase -field Method
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