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Keyword [Oxygen defect]
Result: 1 - 2 | Page: 1 of 1
1.
The Behavior Of Oxygen And Defects In Si-Based Semiconductor Studied By Coincidence Positron Annihilation Spectroscopy
2.
Negative Thermal Expansion Property Of Eu
1-x
Sr
x
MnO
3-δ
（X= 0.1,0.15,0.2） And (Gd
0.5
Eu
0.5
)
0.8
Sr
0.2
MnO
3
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