The Study On The Key Techniques For IC Reliability Evaluation And Design

With the development of the VLSI and the decrease of the failure rate, the point of view that high reliability devices are obtained by design and manufacture has been widely accepted, which requires more advanced techniques of reliability evaluation and design. A new concept of the Equivalent Process Capability Index and its estimating method are provided at PPM level. A probability distribution family named Pearson distribution is introduced and its seven types of probability density function are deeply analyzed. Wide applicability features in Pearson distribution. Based on the study of the distribution's central moments and origin moments, optimizing fitness method is given and by which the parameters characterizing the distribution are obtained. The application of Pearson distribution in reliability evaluation obtains satisfied result. About the techniques of the reliability design, a common method for 1C reliability design is introduced and the failure principles of electronmigration are studied. Finally, the factors that affect the electromigration lifetime are analyzed. Based on the theoretical studies, a band-pass filter circuit is optimized in order to decrease current density and increase the electromigration lifetime. The optimized result is satisfying.