Study Of The Application Of AFM In Membrane Science And Operating Pico Plus AFM In Experiment

This article simply introduces the development histroy of the scanning probe microscope and some main instruments, summarizes the application of the atomic force microscope in membrane,and studies the operation in experiment about Pico Plus atomic force microscope.The atomic force microscope is an analysis tool to the surface of solider with high distinguish. Because the atomic force microscope not only does not have especially request to sample in conducting performance.,but also can work in atmosphere and room temperature.It has more application areaes than the scanning electron microscope. The main application of atomic force microscope in membrane science is: mensurate the surface roughness of membrane,observe aperture structure and mensurate size of membrane, mensurate surface friction of membrane, mensurate surface elasticity of membrane, mensurate surface electrochemistry character of membrane,study the mechanism of membrane form and etc content.Thus,the atomic force microscope has important meaning to detect and analysis membrane and instruct membrane preparation.Applicating Pico Plus atomic force microscope to study imaging the samples of CdZnO thin film, Ge₂Sb₂Te₅ optics memory film,semiconductor film, siller thin film and DLC thin film.Observing their surface configuration, mensurate their surface roughness and analysis their aperture and growth grain size,that can provide scientific gist to estimate quality of membrane and instruct membrane preparation.Study changing the scanning parameteres of the Pico Plus atomic force microscope such as the scanning area,the scanning speed,the integral constant,the proportion constant and the pels,can cause what influence to the scanning inage.We get the variety relation of operating the instrument on thin film,and the result can bring a little convenience to instruct our experiment...