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Keyword [interface traps]
Result: 21 - 29 | Page: 2 of 2
21.
Study On Interface Treatment Technique And The Internal Mechanism For AlGaN/GaN MIS-HEMT
22.
Characterization of 4H-silicon carbide MOSFETs using first principles Coulomb scattering mobility modeling and device simulation
23.
Investigation of theoretical limitations of recombination DCIV methodology for characterization of MOS transistors
24.
Flash memory characterization
25.
Theory and experiments of electron-hole recombination at silicon/silicon dioxide interface traps and tunneling in thin oxide MOS transistors
26.
The Electrical Properties Analysis Of Two-dimensional Material Field Effect Transistors
27.
Research On Manufacturing Process And Characteristics Of SiC MOS Capacitor Based On Stacked Gate Oxide
28.
4H-SiC MOS Capacitor Interface Improvement Process And Electrical Properties
29.
Research On The Effect Of Proton Irradiation On AlGaN/GaN Heterostructure
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