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Keyword [interface traps]
Result: 1 - 20 | Page: 1 of 2
1.
First-principle Study On The Formation Mechanism Of SiC/SiO
2
Interfaces And Interface Defects
2.
Electrical Characteristics And Reliability Of MOSFET Capacitors With Ultra-thin Oxides
3.
The Research On The Properties Of SiC MOS Interface By Conductance Method
4.
Study On Electrical Characteristics Of MOSFETs With High-κ Gate Dielectric
5.
The Study Of Hot Carrier Injection Effect In Sub-Micron MOS Devices
6.
The Study Of Hot Carrier Injection Effect In Sub-micron Mos Devices
7.
Study On The Gate Leakage Current Of Uitra-thin MOS Devices
8.
The Characteristic Research Of AlGaN/AlN/GaN Heterostructure Schottky Contacts
9.
The Device Characteristics Research Of AIN/GaN Heterostructure Field-Effect Transistors
10.
Research On Ionization-induced Defects Of Gated Lateral Bipolartransistor In Hydrogen Ambient
11.
Investigation Of The Interface Between LPCVD-SiN_x Gate Dielectric And Iii-nitride For AlGaN/GaN MIS-HEMTs
12.
Improvement Of Interfacial Electrical Properties Of SiC MOS Devices By ECR Plasma Pretreatments Of SiC Surface
13.
The Study Of High-performance ?-? Transistors With High-? Gate Dielectrics
14.
Research On The Effects Of Interface Trap On The InSb Photovoltaic Infrared Focal Plane Array
15.
Research On The Loss Characteristics Of Sic Power MOSFET
16.
A Simulation Study Of Interfacial Properties Of SiO
2
/4H-SiC MOS
17.
Numerical Simulation Of The ELDRS Effect Accelerated Experimental Method
18.
Research On The Key Technologies Of The Third Generation Antimonide-based Infrared Detectors
19.
Effect Of Interface Traps On The Mobility And Threshold Stability Of SiC MOS
20.
Research On Key Process Of Tunneling Field Effect Transistor Devices
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