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Research And Implementation Of 16 Bit High Speed ADC Fast Test Method

Posted on:2022-07-06Degree:MasterType:Thesis
Country:ChinaCandidate:Y Q LiaoFull Text:PDF
GTID:2518306524493164Subject:Master of Engineering
Abstract/Summary:PDF Full Text Request
With the development of high-speed digital circuit,analog-to-digital converter(ADC)has become an indispensable part of modern digital processing system.The performance index of ADC has a significant impact on the overall index and performance of digital processing system.With the continuous improvement of ADC resolution,the implementation process of existing standard test methods becomes more and more difficult.The traditional test method based on sine fitting has higher test accuracy,but the test time of the algorithm is long,which limits the application of the algorithm in the actual test.This thesis mainly studies the optimization of ADC test algorithm based on maximum likelihood estimation,and focuses on improving the problem of long test time caused by the huge calculation of solving the likelihood equation.One time data acquisition is used to realize the dynamic and static parameters test of high-speed and high-precision ADC,such as inl,SINAD,ENOB,etc.(1)Demand analysis and overall scheme design of high-speed and high-precision ADC test methods.The basic principles of ADC and standard test methods are analyzed.The standard ADC test methods mainly obtain the static parameters of the ADC through histograms,and the FFT method and sine wave fitting algorithm obtain the dynamic parameters of the ADC.As the resolution of the ADC increases,the histogram The test time of the graph method increases exponentially.Compared with the FFT method,the sine wave fitting algorithm does not require coherent sampling,so this article will optimize the sine wave fitting algorithm based on ML.(2)ADC test method optimization.The sine wave fitting algorithm based on maximum likelihood estimation mainly includes two parts: the acquisition of the initial value and the solution of the likelihood equation.The traditional ML-based sine wave fitting algorithm uses the histogram method to obtain the conversion level.Likelihood equation algorithm iteration and testing time is very time-consuming.This article will quickly obtain the conversion level by optimizing the parameter spectrum estimation algorithm,using fewer sampling points to fit the input and output characteristic curve to obtain the INL,and using the optimized PSO algorithm to solve the likelihood function,obtain the fitted sine wave parameters,and calculate SINAD,ENOB and other parameters.(3)AD9268 chip automatic test realization and optimization algorithm verification.By using the clock board of the test machine to provide the clock and the external signal source to provide the analog signal,the test of the dynamic and static parameters of the chip is realized.Using MATLAB software,import the collected data,and test the optimization algorithm proposed in this article.Compared with the traditional maximum likelihood estimation sine wave fitting algorithm,the optimization algorithm test time is reduced by more than 50%.
Keywords/Search Tags:ADC, dynamic and static parameters, sine wave fitting, parameter spectrum estimation, maximum likelihood estimation
PDF Full Text Request
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