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Study On Suspended Particle Detection Technology Based On Scattered Light

Posted on:2017-06-19Degree:MasterType:Thesis
Country:ChinaCandidate:H B ZhangFull Text:PDF
GTID:2348330485459480Subject:Circuits and Systems
Abstract/Summary:PDF Full Text Request
The particle test method based on scattered light is widely studied and adopted with its high measurement speed and wide measurement range in particle detection area.Particle counter,which relies on Mie scattering theory,is an important instrument by most people to measure particle.In this paper,the operational principle and structure of the particle counter are analyzed and summarized at Mie scattering theory. And the influence of the particle radius, and wavelength on particle signal is analyzed. The scattered angle which is used to collect scattered light is also analyzed by reading papers.The system architecture of particle counter is selected by comparing different architectures in the optical sensor.The light trap,reflector and the mirror of light collection are also designed with ZEMAX,and the particle signal is processing in a way of PAM and conversion from single-ended signal to differential signal by building circuit. Data pre-processing is added to software,and the function of count is optimized in the software.
Keywords/Search Tags:particle test, Mie scattering, Lab VIEW
PDF Full Text Request
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