DRAM Memory Moving Inversion~+ Algorithm Analysis

Along with the widespread utilization of large capacity memory chip in each kind of system, overall stability of system is affected by memory chip's stability, therefore, memory chip test becomes more and more important.At present, highly effective test technology is generally used in memory chip's test considering of memory chip's test cost. In view of this situation, this article conducted research to the most widespread DRAM memory test algorithm, made introduction and comparison of different memory test algorithm, analysis the improvement of Moving Inversion algorithm, proposed the Moving Inversion+ algorithm with higher failure coverage rate and better failure diagnosis ability. Through the experiment, the new algorithm's failure diagnosis ability has been sharpened at the expense of slightly increased testing time.This paper organized as following: First, theory background, introduced the DRAM memory test technology, Enumerated main failure model; Then, proposed the improved algorithm -- Moving Inversion+ algorithm and its test structure; Finally, completed evaluation to this new algorithm by experimenting.