Study On The VXI Oriented Test Resource Management

The purpose of VXI oriented test resource management is to offer an interface for the auto test system to control the VXI instruments, so that the generation of stimulus signals as well as the recordation and storage of response signals can be realized. Offering general interface to control VXI instruments is the direction of VXI oriented test resource management in the future. The study purpose of this thesis is to offer a general test resource management method for the project "Platform for Developing Fault Diagnosis Systems of Circuit Boards ".First, this thesis uses the IVI drivers in the instrument oriented test resource management method to achieve the interchangeability of instrument, so that the generation of controlling VXI instrument can be realized. By studying the standards of VXI Plag&Play(VPP) and Interchangeable Virtual Instrument(IVI), this thesis introduces a software architecture that realizes the instrument oriented test resource management method in the VXI-Base diagnosis software development platform, and a method which is provided for calling the driver's functions dynamicly. Using this method we can control the VXI instrument, send the stimulus and record the response.In addition, the IVI driver for digit IO is under development. According to the requirement of digit circuit test software development in the platform, this thesis introduces the "Virtual Test Resource Model" which applies the signal oriented test resource management method and is based on the "Software Interface for Resource Management for A Broad-Based Environment for Test" and IEEE-1445. By this way, the test software development can be separated from test instruments so that the changes of test instruments and signal channels will not affect the development of fault diagnosis software. The model is tested and analyzed by using of the diagnosis of the dual-port RAM circuit board. The result of test indicates that the generation of test resource management method in digit circuit test is realized At last, we review the entire work and suggest the direction for the future research in this field.