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Thermal Transport In Layered Tin Disulfide Nanofilms

Posted on:2021-02-27Degree:MasterType:Thesis
Country:ChinaCandidate:M ZhangFull Text:PDF
GTID:2480306569996309Subject:Physics
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Tin disulfide(SnS2)is a layered n-type semiconductor material that has shown interesting physical properties and great potentials in applications such as photodetectors,sensors,field-effect transistors,battery,etc.According to the density functional theory,SnS2 has an ultra-low lattice thermal conductivity so its application in thermoelectric conversion field has attracted more attention.The understanding of thermal transport in layered SnS2 is essential to optimize the thermal management,energy transport and conversion of these devices.However,related studies on the thermal transport properties of SnS2 are far less than studies on its other physical properties,such as electrical and optical properties.There are still a lot of unknowns about the thermal transport properties of SnS2 nanofilms,especially on the thermal transport of SnS2 nanofilms grown by chemical vapor deposition.In this dissertation,the in-plane thermal conductivities of layered single-crystalline and polycrystalline SnS2 nanofilms with different thicknesses were measured by the Raman optothermal technique at room temperature.We extracted the thermal conductivities of single-crystalline SnS2 nanofilms with 45,77,85 and 171nm-thickness to be 9.2 Wm-1K-1,8.7 Wm-1K-1,8.3 Wm-1K-1and 11.8 Wm-1K-1,and the thermal conductivities of polycrystalline SnS2 with 60,76,and 98 nm-thickness are 5.5 Wm-1K-1,5.9 Wm-1K-1,and 4.8 Wm-1K-1,respectively.The thermal conductivity of the exfoliated single-crystalline SnS2 nanofilm is about twice that of the CVD-grown polycrystalline SnS2 with similar thickness.In addition,to gain insights into the difference and mechanism of the thermal properties between exfoliated and CVD-grownSnS2 nanofilms,by high-resolution transmission electron microscopy measurement to observe the microstructure of SnS2nanofilms,we grained the average grain size of 250 nm for CVD-grown polycrystalline SnS2.By finite element simulation,we found the grain boundary thermal conductance of polycrystalline SnS2 is 60 MWm-2K-1 and the effect of average grain size and uniformity of grain size distribution for the thermal conductivity of polycrystalline SnS2.The non-uniform distribution didn't change the thermal conductivity of polycrystalline SnS2 at the same average grain size,but the heat flow distribution changed.As the average grain size decreases,the thermal conductivity of polycrystalline SnS2 reduces sharply,which implies that phonon grain boundary scattering is dominant in polycrystalline SnS2 with a small grain size.Model predicts that the in-plane thermal conductivity of polycrystalline SnS2will be less than 1 Wm-1K-1,when the average grain size reduces to 15 nm,which shows a possibility of adjusting the thermal conductivity of polycrystalline SnS2 by changing average grain size.The research results of this dissertation provide significant experimental data for the energy transport and thermal management of electronic/optoelectronic devices based onSnS2,and offer an effective guidance for further research on thermoelectric conversion and other applications of polycrystalline SnS2.
Keywords/Search Tags:layered tin disulfide, phonon thermal transport, thermal conductivity, chemical vapor deposition, phonon-boundary scattering
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