| Near-field scanning optical microscopy (NSOM) has become a widespread technique due to its promising capability to image with sub-micron resolution.; The first use of a new tapping-mode NSOM instrument developed in our group is presented here. The system is employed to image silver nanowires fabricated by a non-lithographic, electrochemical templating technique.; The technical problems of NSOM relating to the fabrication of the tip were investigated and solved. Appropriate combinations of the tip parameters were found to provide high transmittance of light and good resolution for both topographic and optical images obtained simultaneously. The improved spatial resolution and low detection limit capabilities of the tapping-mode probe design are demonstrated through the topographic and optical NSOM images of nanowires.; The optical image reveals subwavelength optical information on the nanowires and also indicates the possible distribution of optical fields in the vicinity of the nanowire. |
