Design And Implementation Of Image Acquisition System Based On Xilinx FPGA

With the rapid development of industrialization 4.0 and automation technology,industrial machine vision has become more and more common.More and more industrial manufacturing processes require more intelligence and visualization,which can greatly relieve the manual labor and errors caused by the differences in the personal qualities of the operators.Industrial production therefore requires more digital and intelligent image sensors to provide high-resolution,even ultra-high-resolution image analysis to optimize processes and manufacturing processes,providing the essential conditions for industrial automation.Traditional analog image sensor short transmission distance,poor anti-interference ability,the inconvenience of using such shortcomings triggered analog transmission into digital transmission.However,domestic and foreign digital sensors are generally expensive,bulky,inconvenient to install,and most of them can only be a single measurement and testing.Wafer inspection applications,the machine motion control system to achieve the control accuracy of 1mm,in order to meet the application requirements,testing the conveyor belt with a wafer and adjust the position of the shift,in order to avoid into the post-stage pipeline damage caused by wafer,In order to ensure a good product rate.Therefore,the system requires the accuracy and repeatability of the test results need to meet within 1mm,and testing to be completed within 0.83 s time.In this paper,we combine the research experience and reference scheme of traditional CMOS image processing structure,and design a hardware programmable image acquisition and control module based on Xilinx FPGA,field programmable gate array(FPGA)device.Taking image acquisition as the main research and design Based on the deep analysis of the development of the current image acquisition module and related technical principles,the FPGA-based image acquisition module is discussed and researched in detail,including the introduction of the whole image acquisition system and wafer inspection application background,Technical indicators,the system hardware and software design and implementation of the program design,and finally gives the system for industrial-grade wafer testing application testing and verification.The image acquisition module realized in this thesis is small in size,easy to installand low in cost and suitable for all kinds of image detection of industrial machines.Acquisition module includes front-end image sensor camera,FPGA control circuit board and host computer image display software,for different applications of image detection,only need to modify the underlying firmware module and the upper software,if there is a need to replace the application of the camera to keep the system other hardware Part of the same,you can complete the application-specific configuration,so as to achieve a very short development time for rapid application purposes.Through the bottom-up transmission of the image data,the control of each path truly achieves the parallel work and transmits in parallel so that the collection speed of the entire system is obviously improved,thereby effectively solving the bottleneck of low-speed image transmission.The application of wafer attitude detection shows that the accuracy of the image acquisition module is less than 0.5 degree and the accuracy is less than 0.4 mm.In the aspect of repeatability,the angle is less than 0.15 degree and the position is less than 0.08 mm,and it can be within 50 milliseconds complete testing to meet the system application requirements.