Method Research And System Design For Testing Photoelectric Parameters Of CCD

CCD plays an important role in the field of science such as machine vision andspace remote sensing, to a certain extent, its performances determine the applicationperformances of the whole system. When testing direct at aerospace-grade CCD inpractical application, found some methods have only stay in the test standard leveland the testing system was not universality. Therefore, based on the study of CCDphotoelectric parameter test method and the corresponding description of the testprocedures, a set of universal test system was designed to realize the accuratemeasurement of CCD performance.Firstly, based on the research of the3D noise in the CCD chip, this paperanalyzing the test method of photoelectric-response parameters including responsenon-uniform, signal-to-noise ratio, and also the test method of spectral-responseincluding relative spectral responsivity and the peak wavelength. Meanwhile, givingthe corresponding description of the test procedures.Secondly, on the foundation of the theoretical analysis, an automatic test systemwas designed used for photoelectric parameters testing of CCD. Radiation lightsource is brightness-controlled with constant color temperature according to thedouble integrating sphere system. Monochromatic source achieves themonochromatic wavelength output with high resolution. The designing of the hostcomputer software is guided by the principle that top-down’s frame structure andbottom-up’s modular implementation. The control software is developed with the VB.NET assembled with Matlab language. The additional test suggests that theirradiance non-uniformity is superior to0.87%in the center area(40mm×40mm) ofthe double integrating sphere which can meet the application requirements well.Finally, take the SONY ICX285plane array CCD for example, applied twonoise extraction algorithm to calculate the signal-to-noise ratio and afterwardvalidated theoretically. Based on the method of monochromator, the spectralresponse of plane array CCD is tested and then evaluating the uncertainty of theresults in all respects. And then the noise and other photoelectric parameters aretested.Currently, the design of the system has been applied to the plane array CCD of astar sensor, and the performances meet the test requirements better.