Design And Product Of The Semiconductor Test Apparatus

Semiconductor refers to their conductive capacities between conductors and insulators ofthe material.By measuring the resistivity and electric rate, you can determine the power factor ofa thermoelectric material, calculate the concentration of materials, in order to make accuratejudgments quickly and properties of semiconductor materials, detection of resistivity, electricrates are very necessary.In this paper, the design of the semiconductor material based on AT89C52single chipmicrocomputer in different temperature resistivity electromotive force rate measurement system.Adopting the electric heating furnace as temperature control equipment, adjusting themeasurement of environmental temperature semiconductor. Temperature control part adopts themonolithic integrated circuit control solid state relay to realize the heating process, the controlalgorithm using the Dalin algorithm. Adverse effects of time delayusing the Dalin algorithm caneffectively improve the electric heating furnace to control, reach a good effect.The resistivitymeasured by four probe method to eliminate the influence of the contact resistance and theresistance of wire on the result of the measurement, measurement of electromotive force rate isadopted to rapidly produce temperature difference method to measure the temperature differenceelectromotive force changes with temperature of heating the semiconductor end at both ends ofthe trend. System voltages and temperatures measured signal by signal acquisition module,filters, AD converter and isolation amplifiers pass to the microcontroller via serial port to the PCfor data processing and mapping analysis. Resistivity measurements through multiplemeasurements obtained average value, to reduce the random error and system error; therelationship between thermo-electromotive force and temperature electromotive force ratemeasurement through the heating and cooling process of measured, by the host computer forthermo electromotive force and temperature mapping, and using least squares method of curvefitting. The focus of this paper is to eliminate the impact of interference measurement of smallsignal, improve the temperature control precision and linearity of the measurement process,ensure the accuracy.