Research On The Image Testing Hartmann Wavefront Sensor With Micro-Scanning Technology

This paper is mainly based on the Hartmann wavefront sensor reconstruction principle and the study of basic theories of micro-scanning. Micro-scanning can compensate for the less pixel of optical system measurement detector and not satisfy the demand of high precision. It has the shortcomings low detecting precision. Therefore, the combination of the Hartmann wavefront sensor and micro-scanning technology is presented, which lead the Hartmann wavefront sensor to realize high precision detection by low number of pixel.In this paper a micro-scanning device with single wedge is constructed after classifying and selecting micro-scanning technology. And the Hartmann wavefront sensor with single wedge micro-scanning is designed and simulated. The calculation results are got by research on micro-scanning reconstruction high resolution algorithm and the Hartmann sensor wave front reconstruction algorithm. Through analysis, we can get conclusion adding micro-scanning device can improve the Hartmann wavefront sensor recovery precision.