Design Of Four-Quadrant Detector Noise Measurement System And Research Of Its Application

X equipment are long-term storage, once use. Most of X equipment’ life is instorage condition. In order to make the missile weapon system to keep high reliabilityand combat readiness, X equipment should be tested periodically to confirm theirinherent reliability. Four-quadrant detector is the missile guidance system’s coreelement, directly affecting the accuracy of X equipment. And seekers as one of theweek parts of X equipment is tested more frequent than other parts. So the design of asimple and accurate test system has an important practical value. Low frequency noiseis selected as the measuring object. Low frequency noise not only affects theperformance of the detector, but also can be used to evaluate the photoelectric device’squality, reliability and diagnose device’s defects. What’s more, noise can be testedbelow device’s working condition having small injury. So the testing of noise has abetter applicability for X equipment. At present, four quadrant infrared detectorlow-frequency noise research has just started both at home and abroad. And themeasuring method present is complex and not comprehensive enough. In order to solvethe above problems, this paper designed and built a noise testing system of fourquadrant detector based on virtual instrument, realizing testing four channels at thesame time with high automation. The light current, dark current and noise was testedand analyzed to verify the consistency between the noise testing results and thetraditional electrical parameters testing results. Considering the low frequency noisetheory, failure physics and the testing results, a reliability representation model offour-quadrant detector is established. And an idea of representing the tube shell crackusing noise is raised.Although periodic testing is widely used, too much testing will increase thefailure rate of missile system. So in order to reduce unnecessary testing, realize testingaccording to situation, lower cost of maintenance and guarantee, the article studies thefault diagnosis and life prediction scheme of long-term storage missile. Throughcomparing the differences between X equipment and conventional electronicequipment, a method of applying the PHM technology in active X equipment is putforwarded. And through the research of the missile common failure mode and failuremechanism, considering the failure physics and X equipment’ characteristics, three models and methods suitable for X equipment’ fault diagnosis and life prediction areraised. Finally, a framework of X equipment’ fault diagnosis and life prediction isbuilt.