Research And Design Of The Near-Field Antenna Array System Used For Electromagnetic Compatibility Scanning

With the development of science and technology as well as the arrival of the information society, making all kinds of intelligent electrical and electronic equipment used in large-scale practice of the people’s production and daily life, and a variety of large-scale industry and national defense construction. The number of electrical and electronic equipment is still increasing in unimaginable speed. On the other hand these devices also become more and more compact and fast leading to a great increase of the density in printed circuit board. Accompany with the rapid development are electromagnetic compatibility problems, these problems may lead to performance degradation of the electrical and electronic equipment, even permanent damage. Therefore, how to determine the sources of electromagnetic interference in printed circuit board in a fast and accurate way become a hot research area.This paper firstly introduces the background of EMC’s development, and the potential dangers brought by electromagnetic pollution. These problems spurred the sturdy of electromagnetic interference/compatibility issues. Then a deep discussion of the near-field detection technology is given here and the great advantages are drawn of near-field detection technology compared to the traditional detection technology applied in EMC problems. A planar ultra-wideband dipole antenna is used here to quickly identify the frequency band of the electro-magnetic sources. A serial of normal spiral antennas are designed used for near-field probes.Never has any scholar use normal spiral antenna as probe in EMC measurement before. This can reduce the probe array sensitivity up to-102dBm. At last, the computer control software’s R&D is completed by VEE, a development environment of Agilent Technologies.The research and design of the system can fill the blanks of the domestic study on near-field EMC detection. This system can be largely used in the pre-certification of EMC after completing its development, and will greatly shorten the time of R&D, reduce the expenditure on R&D funding.