Detection Of Wheat Seed Characters Based On Infrared Micro-image

This paper presents the infrared spectrum analysis, Fourier transform infraredmicroscopic image technology and its application in the detection of crop traits, itsbasic structure and experimental techniques. In the paper a new method to measure thethickness of seed coat is devised with the both technique of Fourier transform infraredmicroscopic image and imaging. The result from the method is verified by themeasurement with a micrometer. The distributions of wheat nutrients are mapped bythe Spectrum IMAGE with the method of mapping.In this paper, the infrared image of wheat seed is captured by the reflectance modeof Fourier transform infrared imaging system. The measurement of the thickness ofwheat seed coat is acquired by the program based on MATLAB. The programcalculates the pixel value of seed coat in the wheat infrared image captured by Fouriertransform infrared imaging system and the value of seed coat thickness. The results areverified by the measurement with a micrometer. This method has the advantage ofaccurate data and short time. The standard infrared absorption Spectrums of wheatnutrients are obtained by the integrating sphere model of Fourier transform infraredimaging system. In the Spectrum IMAGE soft the standard infrared absorptionspectrums of wheat nutrition correlate to the infrared image, the distribution of thestarch and protein in the wheat are acquired.