Storage Array Compatibility Test

In recent years, with the development of information technology, the stored data quantity continues to grow. Experts believe that current IT has entered the development stage to take storage as a core. The market size of software and hardware is increasingly expanding, and the compatibility of storage devices becomes the questions which users are most concerned about. The demand of compatibility testing has become increasingly prominent.Making researches on storage compatibility testing, contributes to conduct a comprehensive understanding of the storage compatibility testing, and to enhance the quality of test. Although compatibility testing is impossible to achieve quality assurance fully, but it's essential for storage testing. A neglect of compatibility testing, will lead to higher failure rate due to compatibility. So, how to plan for an appropriate compatibility testing to storage products, just using the limited resources and costs, becomes as focus of various sectors to all the compatibility QEs.In support of the project of"storage solutions and compatibility testing", we make the detailed design of the basic compatibility testing of storage and VxVM, and propose two fault diagnosis strategies to do rapid positioning. The contribution of the dissertation includes:(1) Being aimed at the characteristic of storage application, we analyzes the demand for compatibility testing, and make detailed design of compatibility testing, and adapt a method to generate an ordered pair-wise coverage test set. This method can generate the smallest combination set of test cases, in order to significantly reduce test costs and increase testing efficiency.(2) In the test, the defects are usually more difficult to locate. For this problem, we propose two faut diagnosis strategies. One is based on the minimum combinational coverage set, applied to the situation which the same failure is occurred in a number of test cases. The other is based on fuzzy clustering, and it can take full advantage of the test data in the history for rapid fault Diagnosis positioning.(3) Give an example of basic compatibility testing. Make the statistical analysis to the test results in accordance with the extent. This proves that the defects can be found efficiently in the test.(4) Develop the framework of compatibility testing between storage and VxVM based on exploratory test idea, and analyze the test results.