Digital Photo Frame Chip Test Program Development And Optimization

In the modern times, the Integrated Circuit is the core of the information industry and the high technology. It is also one of the key technologies to promote the national economy. The rapid development of the integrated circuit design and manufacturing technology has a higher request to the integrated circuit test. For new products, it is important to shorten the cycle time from production to the market, because it directly affects the sales volume.In the early stage of product development, if we have a cost-effective test solution, it can improve the efficiency of test development and launch the new product quickly.This article mainly takes Digital Photo Frame (DPF) device as an example, introduces the test solution, the test program development and the optimization. For the new functional module, the test program is more effective to test the product by researching the test methods and test achievement. Based on the large amounts of data of the mass production, the optimized program is able to save the cost of testing. And it is hoped to be helpful to the test of mixed-signal devices.The test methods and test program have transferred to mass production, and the result is satisfied.