Components Pinhole Flaw Detector Research

Groupware Pinhole-Blemish Detected device is used for cathode groupware detection before finished product. Besides, the device is also used for surface detection of GaAs material.The system researched by this dissertation is based on image target detection and computer autocontrol, and it makes the surface detection of cathode groupware and GaAs material automatic and intelligentized. In future, the system will be widely used in photoelectron industry.This dissertation introduces Groupware Pinhole-Blemish Detected system in 5 parts.In part 1, the research background and the rough introduction of Groupware Pinhole-Blemish are narrated. Besides, the task of this dissertation is explained.In part 2, the theory of image target detection is introduced, at the end of this part, an experiment is carried out for the explanation of the theory.In part 3, the hardware devices of Groupware Pinhole-Blemish Detected system, such as image collection device, QT-CM2 device, are included, and the software based on the hardware devices is introduced.In part 4, each part of the software of Groupware Pinhole-Blemish Detected system is exactly described and the software system frame is designed.In part 5, an experiment is carried out as a test of the while software system.In part 6, the whole work is summarized and some problems remaining to be solved are pointed out.