The Design Of BIST For Mixed-signal Circuits Based On The Functional Test

With the development of micro-electronics and integrated circuit,the single digitalor analog circuit is tending to the direction of mixed-signal circuits, which is bringinghuge challenge for the test of integrated circuit. A feasible way is Built-in Self-Test,that is BIST. The technology of digital BIST is quite mature,However, due to thecomplexity, the analog BIST or Mixed-signal circuits BIST is only becoming studyfocus in recent years. there is no theory like digital BIST has been created yet.In the paper,based on studying test of Mixed-signal circuits, a new method forgenerating analog signals for analog BIST ,using oversample and sigma-delta modulatortechniques, is introduced. Under the control of controller, the signal is put on thetested circuit,out signal is sampled,and analyzed to test whether the tested circuit isgood or not.What is more,no-restore-odd square algorithm ,add-tree multiplier andCarry-Look-Ahead-Adder are employed in the process of data processor design,whichreduce the hardware cost, and speed up the Computation.In the end,the BIST system is simulated.The results prove the BIST system isfeasible,and meet the aim of study.