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Research On Typic Failure Model And Improment Measure Of Military Integrated Circuits

Posted on:2007-05-16Degree:MasterType:Thesis
Country:ChinaCandidate:X F BaoFull Text:PDF
GTID:2178360185991633Subject:Electronics and Communications Engineering
Abstract/Summary:PDF Full Text Request
In this dissertation, the importance and urgency for research on reliability of MICs (Military Integrated Circuits) are described, based on the background of the selected topic. By exposition of Reliability theory, the theoritic structure for failure model analyzing and improvement measure of MICs is built, and the failur model of MICs is summarized. By preventing the similar failure model in design and mamufacturing of MICs,the failure rate is effectively lowered.Based on this,effictive measures are made to insrtuct and serve the design & mamafactuning of MICs,so as to prolong the operating life of military equipment ,and to increase the operation efficiency under critical envoriment.In the course of analyzing failure model of MICs and applying measures, data base of MICs is set up providing references gived for building the typic failure model.And by collecting failure records of the MICs and analyzing,the fail mechenism is determined.The fail mechenism of MICs is verified scientificly via various test measures,and related improvements are introduced.Through "test-improment-retest" cycle,the effect of improvement is evaluated comprehensively .In this paper, by analyzing the reliability factors for effecting MICs and ombining with fail analysis results, through the take up measuring in design, manufacturing, materials and selected components, the object for increasing reliability of MICs is realized.
Keywords/Search Tags:Reliability, Failure Mode, Failure Mechanism, DPA
PDF Full Text Request
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