Study On Methods Of Aralyzing The Damaged-optical-thin-film Image And Measuring The Laser-induced-damage Parameters

It is necessary to test the power to resist laser damage in the research of optical thin film. The parameters such as total energy, peak energy density and effective area are important to weigh the power to resist laser damage. It is of great signi(?)icance for researchers to acquire the accurate laser-induced-damage parameters. However, the defects in the optical thin film will reduce the power to resist laser damage. It is also great significance to researching the area, shape, the distribution of the defects for improving the power to resist laser damage. This paper researches the methods of image analysis and attains the goal of the measurement of laser-induced-damage parameters.A new method of calibrating Charge Coupled Device (CCD) optics-electron characteristics is proposed in this paper, which establishes relationship between total energy and total grey-level values and relationship between peak energy density and peak grey-level value respectively to realize the conversion of the above stated parameters from the CCD facula image grey-level value.Additionally, an algorithm based on the theory of magnetism is proposed. The segmentation of the laser-beams image is necessary firstly prior to measuring the parameters. However, there exists the conglutination between the laser-beams images and this method solves the problem. Then, the parameters can be measured according to the grey-level information of laser-beams images and the result of calibrating CCD optics-electron characteristics.A fast image matching algorithm based on wavelet transformation is improved. Observing the local details of damage is helpful to research damages of optical thin...