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Keyword [carrier-induced]
Result: 1 - 5 | Page: 1 of 1
1.
Study On The Modeling And Hot Carrier Induced Reliability Of Ultra-deep Submicrometer LDD MOSFETs
2.
Preparation And Magnetism Of Zn
1-x
TE
x
O (TE=Mn,Co,Cu) Diluted Magnetic Semiconductors Bulk Samples
3.
Study On Hot-Carrier-Induced Reliability Priblems And Lifetime Prediction Method In PMOSFET's
4.
Electrical failure modes in CMOS logic integrated circuits
5.
Study On Low Polarization Dependence Of Refractive Index Change Of Quantum Wire Material
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