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Keyword [SiC/SiO2]
Result: 1 - 10 | Page: 1 of 1
1.
First-principle Study On The Formation Mechanism Of SiC/SiO
2
Interfaces And Interface Defects
2.
Preparation And Properties Of SiC/SiO
2
Nanometer Composite Thin Films And Low-dimensional ZnO Nanometer Structures
3.
The Research On The Properties Of SiC MOS Interface By Conductance Method
4.
Research On The Correlation Between Charge Carriers Trapping Near The SiC-SiO
2
Interface And 1/f Noise In 4H-SiC MOSFETs
5.
Study On Effect Of Annealing Conditions On The Capacitance Characteristics Of MOS 4H-SiC/SiO2
6.
A Study On The Mechanism Of The SiC/SiO
2
Interface Of SiC MOS Devices
7.
A Study On The Tddb Characteristics Of Gate Oxide Layer In 4H-SiC MOS Devices
8.
First-principles Investigation On The Defects At SiC/SiO
2
Interface
9.
Design And Study Of Sic Light Triggered Thyristor Amplified Gate Structure
10.
Reliability Mechanism Of SiC Power MOSFET Based On Low-frequency Noise Theory
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