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Keyword [Oxide traps]
Result: 1 - 3 | Page: 1 of 1
1.
Interfacial Properties And Oxide Trap Capacitance Effect For GaAs MOS Devices With High-k Gate Dielectric
2.
Research On Degradation Mechanism Of SiC VDMOS Under High Temperature And Dynamic Gate Pressure
3.
Study On Plasma Passivation Of Near-interface Oxide Traps And Voltage Stability In SiC MOS Capacitors
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